• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Fire unit The light deflection device is configured to switch a first reflection position (P1) and a second reflection position (P2) in at least a certain area of the reflection portion. The first reflection position (P1) is a position in which light irradiated by the optical irradiation system is to be reflected to the projection optical system so as to be effectively used as part of a desired light distribution pattern. . The second reflection position (P2) is a position in which the light irradiated by the optical irradiation system must be reflected to not be effectively used. The detection unit (17) is disposed in a position in which light reflected at the second reflection position (P2) by the light deflection device can be detected. Figure for the abstract: Fig. 3.
    公开号:FR3076884A1
    申请号:FR1871751
    申请日:2018-11-23
    公开日:2019-07-19
    发明作者:Takayuki Yagi
    申请人:Koito Manufacturing Co Ltd；
    IPC主号:
    专利说明:

    Title of the invention: Fire unit [0001] The present invention relates to a fire unit.
    A vehicle lighting device is known in the prior art which is configured to selectively reflect the light emitted from a light source by means of a reflection device having a plurality of elements. reflections aligned in a matrix shape on a surface and thereby illuminate the front of a vehicle in a predetermined light distribution configuration (patent document 1). The reflection device has the plurality of reflection elements aligned to be tiltable, and can switch positions of the plurality of reflection elements between a first position and a second position. The reflection device is configured to form a light distribution pattern to illuminate a road surface and the like by changing each reflection element between the first position in which a direction of reflection of the light from the light source contributes to the forming the light distribution pattern and the second position in which the direction of light reflection does not contribute to the formation of the light distribution pattern.
    Patent document 1: JP-A-2016-110760 [0004] Since the reflection device has the plurality of aligned reflection elements, when a malfunction occurs during a switching of the positions of certain elements of reflection, an area which is not to be originally illuminated is illuminated and a predetermined light distribution configuration cannot thus be formed. For this reason, it is best to appropriately detect the malfunction.
    The present invention was made due to the above situations, and an object of this is to provide a new fire unit capable of detecting the malfunction of a light deflection device and the like.
    In order to achieve the above goal, a fire unit according to one aspect of the present invention comprises an optical projection system, a light deflection device disposed at the rear of the optical projection system and configured for selectively reflecting incident light to the projection optical system, an irradiating optical system configured to irradiate light on a reflecting portion of the light deflecting device, and a detecting unit configured to detect the reflected light by the light deflection device. The light deflection device is configured to switch, in at least a certain zone of the reflection part, a first reflection position in which the light irradiated by the optical irradiation system is to be reflected towards the optical projection system of so as to be effectively used as part of a desired light distribution configuration and a second reflection position in which the light irradiated by the optical irradiation system must be reflected so as not to be effectively used, and the unit of detection is arranged in a position in which light reflected at the second reflection position by the light deflecting device can be detected.
    According to the above aspect, it is possible to detect a malfunction of the light deflection device on the basis of the light to be irradiated from the optical irradiation system, from the reflection position of the device of light deflection and a state of detection of the light reflected in the detection unit.
    The detection unit can be placed in a position in which it does not interfere with the light reflected at the first reflection position by the light deflection device. The detection unit thus does not interrupt the efficient use of the irradiated light from the optical irradiation system as part of the desired light distribution configuration.
    The detection unit can detect reflected light when the light is irradiated from the optical irradiation system to the reflection part of the light deflection device which is in the second reflection position. Light irradiated from the optical irradiation system is detected as light reflected by the detection unit when the light deflecting device is normally switched to the second reflection position. In this case, it is estimated that there is no malfunction in the light deflection device. Likewise, when the light deflection device is not normally switched to the second reflection position and at least part of it is held in the first reflection position, a part without irradiation (dark part) is detected in at least part of the light reflected by the detection unit. In this case, it is estimated that there is a malfunction in the light deflection device. At the same time, the detection unit can detect reflected light when the light is irradiated from the optical irradiation system to the reflection part of the light deflection device which is in the first reflection position . When the light deflector is normally switched to the first reflection position, the light irradiated from the optical irradiation system is not detected as light reflected by the detection unit. In this case, it is estimated that there is no malfunction in the light deflection device. In addition, when the light deflection device is not normally switched to the first reflection position and at least part of it is held in the second reflection position, any reflected light is detected by the 'detection unit. In this case, it is estimated that there is a malfunction in the light deflection device.
    Another aspect of the present invention is also a fire unit. The light unit comprises an optical projection system, a light deflection device disposed at the rear of the optical projection system and configured to selectively reflect incident light towards the optical projection system, an optical system d irradiation configured to irradiate light on a reflecting portion of the light deflecting device, an inspection light irradiation unit configured to irradiate non-visible light, and a detection unit configured to detect non-visible light visible reflected by the light deflection device. The light deflection device is configured to switch, in at least a certain zone of the reflection part, a first reflection position in which the light irradiated by the optical irradiation system is to be reflected towards the optical projection system of so as to be effectively used as part of a desired light distribution configuration and a second reflection position in which the light irradiated by the optical irradiation system must be reflected so as not to be effectively used, and the unit of detection is arranged in a position in which non-visible light reflected at the first reflection position by the light deflecting device can be detected.
    According to the above aspect, it is possible to detect a malfunction of the light deflection device on the basis of the non-visible light to be irradiated from the light irradiation unit. inspection, of the reflection position of the light deflection device and of a detection state of the non-visible light reflected in the detection unit. In addition, it is possible to check if there is a malfunction in the light deflection device at any time when the light is not irradiated from the optical irradiation system. For this reason, when verifying that there is a malfunction in the light deflection device, it is possible to prevent the light from the optical irradiation system from escaping to the outside. of unity. The light deflection device may include an array of micromirrors. Each mirror element in the micromirror array can be configured to switch the first reflection position and the second reflection position around an axis of rotation. The axis of rotation may extend along a diagonal of a reflecting surface of the mirror element. It is thus possible to quickly and accurately form a light distribution configuration having various shapes.
    At the same time, any combination of the above building blocks, and a method, device, system and the like of the present invention are also relevant as aspects of the present invention.
    According to the present invention, it is possible to provide the new fire unit capable of detecting the malfunction of the light deflection device and the like.
    [Fig.l]
    Figure 1 is a side view showing a schematic structure of a light unit according to a first embodiment.
    [Fig.2A]
    FIG. 2A is a front view showing a schematic structure of a light deflection device according to an example of reference.
    [Fig.2B]
    Figure 2B is a sectional view along a line A-A of the light deflection device shown in Figure 2A.
    [Fig.3]
    Figure 3 is an enlarged view of the reflected light when the light emitted from a light source is reflected in a first reflection position and in a second reflection position by a mirror element.
    [Fig.4]
    Figure 4 is a view for illustrating an axis of rotation of the mirror element according to the first embodiment.
    [Fig.5]
    Figure 5 is a front view showing the schematic structure of the fire unit according to the first embodiment.
    [Fig.6]
    Figure 6 is an enlarged top view showing the light reflected in the light unit of Figure 5.
    [Fig.7]
    Fig. 7 is a view showing an example of an irradiation configuration which is formed by the fire unit according to the first embodiment.
    [Fig.8A]
    Figure 8A shows an imaging range when a malfunction occurs at a portion of a mirror array element in a state where the light deflector is placed in a second reflection position P2.
    [Fig.8B]
    Figure 8B shows an imaging range when a malfunction occurs at a portion of the mirror array element in a state where the light deflector is placed in a first reflection position PI.
    [Fig.9]
    Fig. 9 is an enlarged view showing the reflected light when visible light emitted from the light source and infrared light emitted from an infrared light source are reflected in the first reflection position and in the second position of reflection by the mirror element.
    The present invention will be described below on the basis of preferred embodiments with reference to the drawings. The same elements, components and processing or equivalents shown in the respective drawings are designated with the same references, and their redundant descriptions are appropriately omitted. In addition, the embodiments are not intended to limit the present invention and are by way of example, and all the features and combinations thereof described in the embodiments are not interpreted as essential for the present invention .
    (First embodiment) [0028] [Fire unit] [0029] Figure 1 is a side view showing a schematic structure of a fire unit according to a first embodiment. A light unit 10 of the first embodiment includes an optical projection system 12, a light deflection device 100 disposed on an optical axis Ax of the optical projection system 12 and configured to selectively reflect from incident light toward the projection optical system 12, an optical irradiation system 16 configured to irradiate light on a reflection portion 100a of the light deflection device 100, an image forming unit 17 as a detection unit configured to detect the light reflected at the light deflection device 100, and a control unit 50. The projection optical system 12 comprises a projection lens 18. The irradiation optical system 16 comprises a light source 20, a condenser element 22, and a reflector 24.
    The imaging unit 17 is a camera or video camera having an imaging element and can be any unit capable of converting an optical signal into an electrical signal. Furthermore, a light condensing element (a reflecting element such as a reflector or a refractive element such as a lens) for condensing light reflected at the light deflection device 100 on a light receiving part light from the imaging unit 17 may be disposed between the imaging unit 17 and the light deflector 100.
    The light unit 10 of the first embodiment is mainly used for a vehicle light (for example, a vehicle headlight), but the use for the light unit 10 is not limited to that. The light unit 10 can also be applied to a light from a variety of lighting devices and a variety of moving bodies (an aircraft, a train, and the like). In addition, the fire unit 10 shown in Figure 1 is configured such that the respective components are arranged at the top and bottom with the optical axis Ax which is interposed therebetween. It is thus possible to reduce a size of the fire unit in the width direction. At the same time, the light unit 10 can also be configured so that the respective components are rotated 90 ° around the optical axis Ax and are thus arranged to the right and left with the optical axis Ax which is interposed between them. In this case, it is possible to reduce the size of the fire unit vertically.
    As the light source 20, a semiconductor light emitting device such as a light emitting diode device, a laser diode device, an electroluminescence device and the like, a bulb, an incandescent lamp ( halogen lamp), a discharge lamp, and the like can be used. The light condensing element 22 is configured to guide most of the light emitted from the light source 20 to a reflecting surface 24a of the reflector 24. For example, a convex lens, a hollow light guiding element having a barrel shape, a reflector of which an inner surface is formed as a predetermined reflecting surface, or the like is used as a light condensing element 22. More specifically, a compound parabolic concentrator can be an example of a light condensing element 22. When it is possible to guide most of the light emitted from the light source 20 to the reflecting surface of the reflector 24, the light condensing element may not be used. The light source 20 is mounted in a desired position of a heat sink such as metal, ceramic or the like, for example.
    The light deflection device 100 is arranged on the optical axis X at the rear of the projection optical system 12, and is configured to selectively reflect the light emitted from the light source 20 towards the optical system projection device 12. The light deflection device 100 comprises a plurality of micromirrors such as a micro electromechanical system (MEMS) and an array of micromirrors (DMD) aligned in an array form (array). By controlling angles of the reflecting surfaces of the plurality of micromirrors, respectively, it is possible to selectively change a direction of reflection of the light emitted from the light source 20. That is, a some of the light emitted from the light source 20 can be reflected to the projection optical system 12 and the other light can be reflected to a direction in which it is not actually used. Here, the direction in which the light is not actually used can be a direction in which the reflected light influences less (for example, a direction in which the light hardly contributes to the formation of a desired light distribution configuration. ) or a direction facing a light absorbing element (a light mask element).
    The projection optical system 12 of the first embodiment is configured such that a network of micromirrors (which will be described later) of the light deflection device 100 is arranged in the vicinity of a center of the projection lens 18. At the same time, the projection optical system 12 may have a plurality of optical elements such as lenses. Likewise, the optical element included in the projection optical system is not limited to the lens and can be a reflection element.
    At the same time, the projection optical system 12 of the first embodiment includes the reflector 24 configured to reflect the light emitted from the light source 20 to the light deflection device 100. The reflector 24 is configured to focus the reflected light onto the reflecting part 100a of the light deflecting device 100. The light emitted from the light source 20 can be allowed to be directed towards the reflecting part 100a of the light deflecting device 100 lossless.
    In addition, the reflecting surface 24a of the reflector 24 has a larger surface than the reflecting part 100a of the light deflection device 100. It is thus possible to miniaturize the light deflection device 100. Similarly, the irradiation optical system 16 of the first embodiment comprises the light source 20 comprising a semiconductor light emitting device, and the compound parabolic light condenser element 22 configured to condense the light emitted from the light source 20. The light emitted from the light source 20 can be allowed to be directed to the reflection part 100a of the light deflection device 100 without loss.
    The light unit 10 configured as described above can be used for a headlight with variable light distribution configured to implement partial lighting / extinction of lights.
    [Light deflection device] [0039] Figure 2A is a front view showing a schematic structure of a light deflection device according to an example of reference, and Figure 2B is a sectional view along a line AA of the light deflection device shown in FIG. 2A.
    As shown in FIG. 2A, a light deflection device 100 of the reference example comprises an array of micromirrors 104 in which a plurality of small mirror elements 102 is aligned in the form of a matrix, and a transparent cover element 106 disposed on a front side (a right side of the light deflection device 100 shown in FIG. 2B) of the reflective surfaces 102a of the mirror elements 102. The cover element is made of glass, of material plastic or equivalent, for example.
    Each mirror element 102 of the micromirror array 104 is configured to switch a first position of reflection PI (a position in solid line shown in FIG. 2B) in which the light emitted from the light source must be reflected to the projection optical system so as to be effectively used as part of a desired light distribution configuration and a second reflection position P2 (a dotted position shown in Figure 2B) in which the light emitted from the light source must be reflected so as not to be effectively used.
    Figure 3 is an enlarged view of the reflected light when the light emitted from the light source is reflected in the first reflection position and the second reflection position by the mirror element. In FIG. 3, the network of micromirrors is represented by a mirror element so as to simplify the description. In addition, the light condenser element 22 shown in Figure 1 is omitted.
    As shown in Figure 3, since the light emitted from the light source 20 is condensed and reflected by the reflector 24, the incident light Lin is not completely parallel light. That is, when the incident light Lin is incident on the reflecting surface 102a of the mirror element 102, an angle of incidence thereof is enlarged to some extent. The mirror element 102 is arranged such that when the mirror element 102 reflects the incident light Lin in the first reflection position PI, the reflected light RI is mainly directed towards the projection lens 18. In addition, as this is shown in Figure 3, the mirror element 102 is arranged so that when the mirror element 102 reflects the incident light Lin in the second reflection position P2, the reflected light R2 is not directed towards the projection lens 18.
    By controlling the reflection position of each mirror element 102 to selectively change the direction of reflection of the light emitted from the light source 20, it is possible to obtain a projection image or an image desired reflection and light distribution configuration. That is to say that the light deflection device 100 of the first embodiment is configured to switch, in at least certain mirror elements 102 of the reflection part 100a, the first reflection position P 1 in which the light irradiated by the optical irradiation system 16 must be reflected towards the optical projection system 16 so as to be effectively used as part of a desired light distribution configuration and the second reflection position P2 in which the irradiated light by the optical irradiation system 16 must be reflected so as not to be effectively used. The imaging unit 17 is disposed in a position in which the reflected light R2 reflected in the second reflection position P2 by the mirror element 102 can be detected.
    Figure 4 is a view intended to illustrate an axis of rotation of the mirror element 102 according to the first embodiment. The mirror element 102 has the quadrangular reflecting surface 102a (for example square, rhombus, rectangle and parallelogram). Each mirror element 102 is configured to switch the first reflection position PI and the second reflection position P2 around an axis of rotation C1 extending along a diagonal of the quadrangular reflecting surface 102a. It is thus possible to quickly and accurately form a light distribution configuration having various shapes.
    Figure 5 is a front view showing the schematic structure of the fire unit 10 of the first embodiment. Figure 6 is an enlarged top view showing the light reflected in the light unit of Figure 5. Figure 7 is a view showing an example of an irradiation configuration which is formed by the light unit 10 of the first embodiment.
    As shown in Figures 5 and 6, the optical irradiation system 16 of the first embodiment is provided for irradiating the mirror element 102 from the reflection part of the light deflection device 100 from a position deviating towards the front face side (a right side of the optical axis Ax shown in FIG. 6) from the first reflection position PI on the basis of a vertical plane S (plane XZ) comprising the optical axis Ax of the projection optical system 12.
    The optical irradiation system 16 of the light unit 10 configured as described above is intended to irradiate the reflection part 100a of the light deflection device 100 from a position s' moving towards the front face of the first reflection position PI, rather than the front face of the second reflection position P2. For this reason, an angle of incidence and an angle of reflection of light from the irradiation optical system 16 in the first position of reflection PI are smaller than an angle of incidence and a angle of reflection in the second position of reflection P2. As a result, it is possible to compact an arrangement of the optical irradiation system 16 and of the optical projection system
    12. In addition, since the angle of incidence and the angle of reflection with the mirror element 102 in the first position of reflection PI are small, the reflected light which must not be incident on the projection optical system 12 is reduced.
    That is, it is possible to use the light from the irradiation optical system 16 for the lossless light distribution configuration.
    The optical irradiation system 16 is arranged in a location turned around the optical axis Ax of α ° (0 <a <45) towards a side near the front face of the first reflection position PI, on the base of the vertical plane S comprising the optical axis Ax of the optical projection system 12. At the same time, the rotation angle a can be changed in various ways in correspondence with an adjustment of a rotation angle of the mirror element 102 (angle displacements of the first reflection position and of the second reflection position around the axis of rotation C1, which is a center of rotation) but is preferably 5 ° or more and 40 ° or less.
    As shown in Figure 7, the fire unit 10 configured as described above can implement a substantially rectangular PH irradiation configuration. That is, the entire irradiation optical system 16 is rotated assuming that a light source image is rotated when it is reflected at the light deflector 100, so that it it is possible to easily implement a desired light distribution configuration. In addition, the entire irradiation optical system 16 is rotated maintaining a relative arrangement relationship between the light source 20 and the reflector 24, so that when the light source image is reflected on the reflector 24 , a reflection image is not changed and reaches the light deflection device 100. Therefore, it is possible to easily perform an optical design. Thus, while implementing the desired light distribution configuration, it is possible to compact an arrangement of the complete light and to increase an amount of the light reflected so as to be incident on the projection optical system 12.
    Next, a function of the image forming unit 17 for detecting the malfunction of the light deflection device 100 is described. The light unit 10 of the first embodiment can detect a malfunction of the light deflection device 100, based on the light to be irradiated from the optical irradiation system 16, from the reflection position (the first reflection position or the second reflection position) of the light deflection device 100, and information of a detection state (a dark part or a light part in an image) of the light reflected in the the image forming unit 17. The method of detecting malfunction of the light deflection device 100 is more specifically described in the following.
    As shown in Figure 3, the image forming unit 17 is arranged in a position in which it does not interfere with the reflected light RI reflected in the first reflection position PI by the deflection device of light 100. The imaging unit 17 thus does not interrupt the efficient use of the irradiated light from the irradiation optical system 16 as part of the desired light distribution configuration.
    Figure 8A shows an imaging range when a malfunction occurs at a portion of the mirror array element in a state where the light deflection device 100 is placed in the second reflection position P2, and Figure 8B shows an imaging range when the malfunction occurs at a portion of the mirror array element in a state where the light deflection device 100 is placed in the first reflection position Pl.
    The control unit 50 of the fire unit 10 is configured to control the operations of the optical irradiation system 16 and the light deflection device 100 so as to carry out a detection operation to check whether it there is a malfunction in the light deflection device 100 at a predetermined time. More specifically, the control unit 50 is configured to turn on the full light source 20 of the optical irradiation system 16 to irradiate the reflection portion 100a of the light deflection device 100 with light and thereby control the light device deflection of light 100 such that all the mirror elements 102 are placed in the second reflection position P2, at the time (for example during stopping or when the light unit is not in use) when the irradiation of the fire unit 10 is not hindered. In this state, the imaging unit 17 is configured to detect the reflected light R2 from the reflection portion 100a of the light deflection device 100.
    The incident light Lin irradiated from the optical irradiation system 16 is thus detected as the reflected light R2 having no defective image (dark part) by the image forming unit 17 when all of the mirror elements 102 of the light deflection device 100 are normally switched to the second reflection position P2. In this case, it is estimated that there is no malfunction in the light deflection device 100.
    On the other hand, when some of the mirror elements 102 are held in the first reflection position P1 due to the malfunction, a defective image (a part without irradiation (dark part)) D is detected in a part. of the reflected light R2 of the image taken P, as shown in FIG. 8A. In this case, it is estimated that there is a malfunction in the light deflection device 100, and the light distribution control (for example, switching the light source on and off) can then be performed assuming the malfunction of certain mirror elements 102.
    The control unit 50 is configured to turn on the entire light source 20 of the optical irradiation system 16 to thereby irradiate the reflection portion 100a of the light deflection device 100 with light and to control the deflection of light 100 such that all the mirror elements 102 are in the first reflection position P 1, at the moment when the irradiation of the light unit 10 is not hindered. In this state, the imaging unit 17 is configured to detect the reflected light R2 from the reflection portion 100a of the light deflection device 100.
    The incident light Lin irradiated from the optical irradiation system 16 is thus not at all detected as reflected light R2 by the image forming unit 17 when all the mirror elements 102 of the device light deflection 100 are normally switched to the first reflection position P1. In this case, it is considered that there is no malfunction in the light deflection device 100.
    On the other hand, when some of the mirror elements 102 are held in the second reflection position P2 due to the malfunction, a light spot (reflected light) B is detected in part of an area, which corresponds to the reflected light R2, of the image taken P, as shown in FIG. 8B. In this case, it is estimated that there is a malfunction in the light deflection device 100.
    (Second embodiment) A fire unit of a second embodiment is different from the fire unit 10 of the first embodiment in that it comprises an irradiation unit of inspection light configured to radiate infrared light, which is non-visible light. In the following, the redundant descriptions with the configurations and effects of the fire unit 10 are appropriately omitted. Fig. 9 is an enlarged view showing the reflected light when visible light emitted from the light source and infrared light emitted from an infrared light source are reflected in the first reflection position and in the second position of reflection by the mirror element.
    As shown in Figure 9, a light unit 110 of the second embodiment comprises a projection lens 18 configuring a projection optical system, the light deflection device 100, the light source 20 configuring an irradiation optical system configured to irradiate light on the reflection portion of the light deflection device 100, an inspection light irradiation unit 26 configured to irradiate infrared light, and the training unit image 17 configured to detect infrared light reflected from the light deflecting device 100. The imaging unit 17 is arranged in a position in which the infrared light (the reflected light
    RI ’) reflected in the first PI reflection position by the light deflection device 100 can be detected.
    The light emitted from the light source 20 is condensed by a light condensing element (not shown), and the incident light Lin is incident on the reflecting surface 102a of the mirror element 102. The element mirror 102 is arranged such that when the mirror element 102 reflects the incident light Lin in the first reflection position PI, the reflected light RI is mainly directed towards the projection lens 18. Furthermore, as shown in FIG. 3, the mirror element 102 is arranged so that, when the mirror element 102 reflects the incident light Lin in the second reflection position P2, the reflected light R2 is not directed towards the lens projection 18.
    In addition, in the light unit 110, the infrared light emitted from the inspection light irradiation unit 26 is condensed by a light condensing element (not shown), and the incident light In is incident on the reflecting surface 102a of the mirror element 102. The mirror element 102 is arranged so that when the mirror element 102 reflects the incident light In in the first position of reflection PI, the reflected light RI 'is mainly directed towards the imaging unit 17. At the same time, the light unit 110 comprises an infrared filter 28 disposed between the mirror element 102 and the unit forming image 17 and configured to cut visible light and to transmit infrared light so that some of the visible light from the light source 20 and visible light from outside of the unit are not incident on the imaging unit 17.
    The fire unit 110 is preferably configured so that the incident light Lin coming from the light source 20, the incident light In coming from the inspection light irradiation unit 26 and the reflected lights RI, R2, RI 'reflected by the reflection part 100a of the light deflection device 100 do not overlap.
    A control unit of the fire unit 110 configured as described above is configured to control the operations of the light source 20, the inspection light irradiation unit 26 and the device light deflection 100 so as to perform a detection operation to check if there is a malfunction in the light deflection device 100 at a predetermined time. More specifically, the control unit is configured to turn on the complete light source of the inspection light irradiation unit 26 to thereby irradiate the reflection part 100a of the light deflection device 100 with infrared light and for controlling the light deflection device 100 so that all the mirror elements 102 are in the second reflection position P2, at the time (for example during stop or when the light unit is not in use ) where the irradiation of the fire unit 10 is not hindered. In this state, the imaging unit 17 is configured to detect whether there is reflected light RI ’from the reflection portion 100a of the light deflection device 100.
    Thus, the incident light In irradiated from the inspection light irradiation unit 26 is not at all detected as reflected light RI 'when all the mirror elements 102 of the deflection device light 100 are normally switched to the second reflection position P2. In this case, it is estimated that there is no malfunction in the light deflection device 100.
    On the other hand, when some of the mirror elements 102 are held in the first reflection position P1 due to the malfunction, a light spot (the reflected light) B is detected in part of an area, which corresponds to the reflected light RI, of the image taken P, as shown in FIG. 8B. In this case, it is estimated that there is a malfunction in the light deflection device 100, and the light distribution control (for example switching on and off of the light source) can then be carried out by assuming that malfunction of certain mirror elements 102.
    Like the first embodiment, the control unit can be configured to turn on the entire light source of the inspection light irradiation unit 26 to thereby irradiate the reflection portion 100a of the deflection device of light 100 with infrared light, and to control the light deflection device 100 so that all of the mirror elements 102 are in the first reflection position P1. At that time, as shown in the FIG. 8A, when a defective image (a part without irradiation (dark part) D) is detected in a part of the reflected light RI 'of the image taken P, it is thought that some of the mirror elements 102 are maintained in the second reflection position P2, and it is estimated that there is a malfunction in the light deflection device 100.
    In this way, the fire unit 110 of the second embodiment can detect the malfunction of the light deflection device 100, based on the infrared light to be irradiated from the unit d irradiation of inspection light 26, of the reflection position (the first reflection position or the second reflection position) of the light deflection device 100, and of the detection state of the light reflected in the unit 17. In addition, since infrared light is used as the inspection light, it is possible to check if there is malfunction in the light deflector 100, at any when the light is not irradiated from the optical irradiation system.
    The fire unit 110 of the second embodiment uses infrared light, rather than visible light from the optical irradiation system, when verifying that there is a malfunction in the light deflection device 100. It is therefore possible to prevent visible light from the optical irradiation system from escaping outside the light unit 110. In addition, since infrared light is used as an inspection light, the exterior light of the lamp hardly influences the unit of fire.
    Although the present invention has been described with reference to embodiments, the present invention is not limited to the embodiments, and suitable combinations and replacements of the configurations of the respective embodiments are also included. in the present invention. In addition, it is possible to appropriately exchange the combinations and processing sequences of the respective embodiments and to implement modifications such as different design changes from the respective embodiments, based on the knowledge. skilled in the art, and modified embodiments are also included within the scope of the present invention.
    权利要求:
    Claims (1)
    [1" id="c-fr-0001]
    Fire unit (10) characterized in that it comprises:
    a projection optical system (12);
    a light deflection device (100) which is arranged at the rear of the projection optical system (12) and which is configured to selectively reflect incident light towards the projection optical system (12);
    an optical irradiation system (16) configured to irradiate light on a reflection portion (100a) of the light deflection device (100); and a detection unit (17) configured to detect light reflected by the light deflecting device (100), wherein the light deflecting device (100) is configured to switch a first reflecting position (PI) and a second reflection position (P2) in at least a certain area of the reflection part (100a), the first reflection position (PI) is a position in which the light irradiated by the optical irradiation system (16) must be reflected back to the optical projection system (12) so as to be effectively used as part of a desired light distribution configuration, and the second reflection position (P2) is a position in which the light irradiated by the system irradiation optics (16) must be reflected so as not to be effectively used, and in which the detection unit (17) is arranged in a position in which light reflected at the second reflection position (P2) by the light deflection device (100) can be detected.
    The light unit (10) according to claim 1, wherein the detection unit (17) is arranged in a position in which the detection unit (17) does not interfere with the light reflected in the first reflection position (PI ) by the light deflection device (100). The light unit (10) according to claim 1 or 2, wherein the detection unit (17) detects the reflected light when the light is irradiated from the optical irradiation system (16) to the reflecting part ( 100a) of the light deflection device (100) which is in the second reflection position (P2).
    Fire unit (110) characterized in that it comprises: [Claim 5] an optical projection system;
    a light deflection device (100) which is arranged at the rear of the projection optical system and which is configured to selectively reflect incident light towards the projection optical system;
    an irradiation optical system configured to irradiate light on a reflection portion of the light deflection device (100); an inspection light irradiation unit (26) configured to irradiate non-visible light, and a detection unit (17) configured to detect non-visible light reflected by the light deflection device (100), in which the light deflection device (100) is configured to switch a first reflection position (PI) and a second reflection position (P2) in at least a certain area of the reflection part, the first reflection position (PI ) is a position in which the light irradiated by the optical irradiation system is to be reflected back to the optical projection system so as to be effectively used as part of a desired light distribution configuration, and the second reflection position (P2) is a position in which the light irradiated by the optical irradiation system must be reflected so as not to be effective. ely used, and in which the detection unit is arranged in a position in which non-visible light reflected at the first reflection position (PI) by the light deflection device (100) can be detected.
    A light unit (10; 110) according to any of claims 1 to 4, wherein the light deflection device (100) comprises an array of micromirrors, and wherein each mirror element of the array of micromirrors is configured to switch the first reflection position (PI) and the second reflection position (P2) around an axis of rotation.
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    同族专利:
    公开号 | 公开日
    US20190161005A1|2019-05-30|
    CN109855042A|2019-06-07|
    CN209325661U|2019-08-30|
    FR3076884B1|2021-06-11|
    DE102018220106A1|2019-06-06|
    JP6985907B2|2021-12-22|
    US10696225B2|2020-06-30|
    JP2019102207A|2019-06-24|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    DE19530008B4|1995-08-16|2005-02-03|Automotive Lighting Reutlingen Gmbh|Illumination device for vehicles with a reflective deflection device|
    JP4016876B2|2003-04-23|2007-12-05|セイコーエプソン株式会社|projector|
    JP5360057B2|2008-05-28|2013-12-04|株式会社ニコン|Spatial light modulator inspection apparatus and inspection method, illumination optical system, illumination optical system adjustment method, exposure apparatus, and device manufacturing method|
    CN102235618B|2010-04-23|2014-11-19|中强光电股份有限公司|Illumination module and projector|
    JP6214202B2|2013-05-07|2017-10-18|株式会社小糸製作所|Lamp unit and light deflector|
    JP6517008B2|2014-12-03|2019-05-22|株式会社小糸製作所|Lighting unit|
    JP6985907B2|2017-11-30|2021-12-22|株式会社小糸製作所|Lamp unit|JP6985907B2|2017-11-30|2021-12-22|株式会社小糸製作所|Lamp unit|
    US10551022B2|2018-01-31|2020-02-04|Koito Manufacturing Co., Ltd.|Vehicle lamp|
    CN112113184A|2019-06-21|2020-12-22|深圳市中光工业技术研究院|Lighting system with detection function|
    法律状态:
    2019-09-27| PLFP| Fee payment|Year of fee payment: 2 |
    2020-09-25| PLFP| Fee payment|Year of fee payment: 3 |
    2020-10-23| PLSC| Publication of the preliminary search report|Effective date: 20201023 |
    2021-09-27| PLFP| Fee payment|Year of fee payment: 4 |
    优先权:
    申请号 | 申请日 | 专利标题
    JP2017-230008|2017-11-30|
    JP2017230008A|JP6985907B2|2017-11-30|2017-11-30|Lamp unit|
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